Refereed Publications – 2017

1. V. P. Yanambaka, S. P. Mohanty, E. Kougianos, D. Ghai, and G. Ghai, “Process Variation Analysis and Optimization of a FinFET based VCO“, IEEE Transactions on Semiconductor Manufacturing (TSM), Volume 30, Issue 02, May 2017, pp. 126-134.